| Название: | Afm visualization of conductivity and morphology of bcx-film surface obtained by sld method |
|---|---|
| Авторы и аффилиации: |
Zinin P.V. (основной автор / докладчик) Scientific and Technological Center of Unique Instrumentation, Russian Academy of Sciences Bykov A.A. Scientific and Technological Center of Unique Instrumentation, Russian Academy of Sciences Romanov R.I. National Research Nuclear University ‘‘MEPhI’’ Korneeva A.A. Scientific and Technological Center of Unique Instrumentation, Russian Academy of Sciences Andreev A.V. Scientific and Technological Center of Unique Instrumentation, Russian Academy of Sciences Belykh A.Y. Scientific and Technological Center of Unique Instrumentation, Russian Academy of Sciences Krasnoborod'Ko S.Y. Scientific and Technological Center of Unique Instrumentation, Russian Academy of Sciences Kukushkin V.A. Scientific and Technological Center of Unique Instrumentation, Russian Academy of Sciences |
| Аннотация: | Materials with nonstandard physical properties are widely used in various fields of science and technology, from microelectronics to heavy industrial installations. At one time, international scientific teams carried out mathematical calculations showing that the most promising compounds of B–C structures which, under certain external conditions and concentration ratios, have strong chemical sp2 and sp3 bonds. Such materials are characterized by high hardness, resistance to aggressive media, and conductivity. This work is aimed at the synthesis and study of carbon-containing BCx films. This paper presents the results of measuring a thin BC5 film. The spectral characteristics of the film, data on its layer thickness, conductivity, and composition were obtained by using X-ray, Raman, and photoelectron spectroscopy. |
| Тип: | Журнал |
| Название журнала: | OPTOELECTRONICS, INSTRUMENTATION AND DATA PROCESSING |
| Том: | 60 |
| Страницы: | 243-249 |
| Номера тем гос.задания: | FFNS-2022-0008. |
| Ссылка на ЦКП и/или УНУ: | имеется |
| DOI: | 10.3103/S8756699024700298 |
| ISSN: | 8756-6990 |
| Ссылка на страницу в eLIBRARY: | https://www.elibrary.ru/item.asp?id=68542472 |
| eLIBRARY ID: | 68542472 |
| Код EDN: | UQRPIR |
| Рекомендуемая библиографическая ссылка: | Zinin P.V., Bykov A.A., Romanov R.I., Korneeva A.A., Andreev A.V., Belykh A.Y., Krasnoborod'Ko S.Y., Kukushkin V.A. Afm visualization of conductivity and morphology of bcx-film surface obtained by sld method // OPTOELECTRONICS, INSTRUMENTATION AND DATA PROCESSING. 2024. Vol. 60. P. 243-249. EDN: UQRPIR. DOI: 10.3103/S8756699024700298. |